Rapid diagnosis of hot spot failure of crystalline silicon PV module based on I-V curve

Hot spot failure of PV modules has become one of the most important factors affecting the reliability of PV power generation systems. This study proposes a hot spot fault diagnosis method based on I-V curve of PV modules, which is based on distance calculation between scan points and lines formed by the points. By this method, various types of I-V curves can be quickly distinguished to diagnose hot spot faults. Finally, the diagnostic effect of the method was evaluated through a large number of PV power station field tests.