期刊
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A
卷 37, 期 5, 页码 -出版社
A V S AMER INST PHYSICS
DOI: 10.1116/1.5100340
关键词
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资金
- Ministry of Science and Technology, Taiwan, ROC [MOST 107-2622-E-131-001-CC2, MOST 106-2218-E-131-003, MOST 107-2221-E-131-003]
This paper introduces a novel TiAlSiN/CrN multilayer film deposited on substrates of silicon Si (100) or tungsten carbide steel using high-power impulse magnetron sputtering. The authors systematically analyzed the effects of N-2/Ar flow ratio on the microstructural and mechanical properties of the thin films using TEM, SEM, XRD, and nanoindentation measurements. SEM images revealed that increasing the N-2/Ar flow ratio led to corresponding decreases in the thickness of TiAlSiN/CrN multilayer films (from 1.9 to 0.5 mu m) and the bilayer (from 21.5 to 6.6 nm). XRD and TEM analysis revealed that under the same conditions, the structure of a TiAlSiN monolayer transformed from amorphous to crystallite. Thus, increasing the N-2/Ar flow ratio from 5% to 80% led to a sharp increase in hardness (from 9.8 to 19.6 GPa) and Young's modulus (from 178 to 245 GPa).
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