期刊
JOURNAL OF STATISTICAL MECHANICS-THEORY AND EXPERIMENT
卷 -, 期 -, 页码 -出版社
IOP PUBLISHING LTD
DOI: 10.1088/1742-5468/ab38bd
关键词
fractal growth; irreversible aggregation phenomena; numerical simulations
资金
- Universidad de Buenos Aires
The phenomenon of dielectric breakdown is a clear example of the growth process of a non-equilibrium structure. The introduction of non equilibrium models and the application of fractal geometry has led a good understanding of the morphology of the generated structures known as electrical trees. In this paper we compare the different statistical entropies that can be applied to the fractal simulation of the dielectric breakdown phenomenon such as the entropies of Renyi, Tsallis, Boltzmann-Gibbs and Shannon. We also analyze the behavior of the fractal dimension in terms of the four entropies studied for the simulation of the growth of electrical trees with the dielectric breakdown model.
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