期刊
JOURNAL OF POLYMER SCIENCE PART B-POLYMER PHYSICS
卷 57, 期 23, 页码 1622-1634出版社
WILEY
DOI: 10.1002/polb.24875
关键词
coverage; fractal dimension; image analysis; organic semiconductor; solution processing
资金
- Undergraduate Research Support Grant of the University of Illinois
- NSF CAREER grant [DMR 18-47828]
Morphology modulation offers significant control over organic electronic device performance. However, morphology quantification has been rarely carried out via image analysis. In this work, we designed a MATLAB program to evaluate two key parameters describing morphology of small molecule semiconductor thin films: fractal dimension and film coverage. We then use this program in a case study of meniscus-guided coating of 2,7-dioctyl[1]benzothieno[3,2-b][1]benzothiophene (C-8-BTBT) under various conditions to analyze a diverse and complex morphology set. The evolution of morphology in terms of fractal dimension and film coverage was studied as a function of coating speed. We discovered that combined fractal dimension and film coverage can quantitatively capture the key characteristics of C-8-BTBT thin film morphology; change of these two parameters further inform morphology transition. Furthermore, fractal dimension could potentially shed light on thin film growth mechanisms. (c) 2019 Wiley Periodicals, Inc. J. Polym. Sci., Part B: Polym. Phys. 2019
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