期刊
INFRARED PHYSICS & TECHNOLOGY
卷 101, 期 -, 页码 133-137出版社
ELSEVIER
DOI: 10.1016/j.infrared.2019.06.011
关键词
InAs/GaSb, type-II superlattice; Mid-wave infrared; Silicon photonics
资金
- Shanghai Sailing Program [17YF1429300]
- ShanghaiTech University [F-0203-16-002]
- UK EPSRC First Grant [EP/R006172/1]
- UK DSTL grant [DSTLX-1000107901]
- EPSRC [EP/P006973/1, EP/R006172/1, 1837222] Funding Source: UKRI
- Engineering and Physical Sciences Research Council [EP/R006172/1] Funding Source: researchfish
In this paper, mid-wave infrared photodetection based on an InAs/GaSb type-II superlattice p-i-n photodetector grown directly on Si substrate is demonstrated and characterized. Excitation power dependence on integrated intensity from the photoluminescence measurements reveals a power coefficient of P similar to I-0.74, indicating that defects related process is playing an important role in the predominant recombination channel for photo-generated carriers. At 70 K, the device exhibits a dark current density of 2.3 A/cm(2) under - 0.1 V bias. Arrhenius analysis of dark current shows activation energies much less than half of the active layer bandgap, which suggests that the device is mainly limited by surface leakage and defect-related generation-recombination, consistent with the photoluminescence analysis. The detector shows 50% cutoff wavelength at similar to 5.5 mu m at 70 K under bias of -0.1 V. The corresponding peak responsivity and specific detectivity are 1.2 A/W and 1.3 x 10(9) cm.Hz(1/2)/W, respectively. Based on these optoelectronics characterization results, reduction of defects by optimizing the III/V-Si interface and material growth quality are argued to be the main factors for performance improvement in this Si-based T2SL detector towards low cost, large-format MWIR detection system on Si photonics platform.
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