期刊
ACTA MATERIALIA
卷 175, 期 -, 页码 297-313出版社
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.actamat.2019.05.036
关键词
Dislocation density; Metal plasticity; Electron back-scatter diffraction (EBSD); High-resolution synchrotron diffraction (HRSD); Peak broadening
资金
- DOE Office of Science [DE-AC02-06CH11357]
- NSERC Discovery Grant
The accumulation of the dislocations and development of dislocation structures in plastically deformed Ni201 is examined using dedicated analyses of Electron Back-Scatter Diffraction (EBSD) acquired orientation maps, and High-Resolution Synchrotron Diffraction (HRSD) acquired patterns. The results show that the minimum detectable microstructure-averaged (bulk) total dislocation density (rho(T)) measured via HRSD is approximately 1E13 m(-2), while the minimum GND density (rho(G)) measured via EBSD is approximately 2E12 m(-2) - the EBSD technique being more sensitive at low plastic strain. This highlights complementarity of the two techniques when attempting to quantify amount of plastic deformation (damage) in a material via a measurement of present dislocations and their structures. Furthermore, a relationship between EBSD-measured rho(G) and the size of HRSD-measured Coherently Scattering Domains (CSDs) has been mathematically derived - this allows for an estimation of the size of CSDs from EBSD-acquired orientation maps, and conversely an estimation of rho(G) from HRSD-measured size of CSDs. The measured evolution of rho(T), and rho(G) is compared with plasticity theory models - the current results suggest that Ashby's single-slip model underestimates the amount of ONDs (rho(G)), while Taylor's model is correctly predicting the total amount of dislocation (rho(T)) present in the material as a function of imparted plastic strain. (C) 2019 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
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