期刊
SENSORS AND ACTUATORS A-PHYSICAL
卷 291, 期 -, 页码 167-173出版社
ELSEVIER SCIENCE SA
DOI: 10.1016/j.sna.2019.03.050
关键词
Lead-free piezoelectric film; Vibration energy harvester; Rayleigh constant; Domain wall; rf magnetron sputtering
资金
- CREST, JST, Japan [JPMJCR16Q4]
The present study reports the improvement of piezoelectric properties of sputtered BiFeO3 films, and application to piezoelectric MEMS vibration energy harvesters (MEME-pVEHs). (100)-oriented BiFeO3 films were obtained on (100)-oriented LaNiO3 bottom electrodes grown on (100) Si substrates at deposition temperatures ranging from 450 degrees C to 550 degrees C. While all the films showed well-defined ferroelectric hysteresis loops at room temperature, the highest e(31),(f) coefficient of -3.6 C/m(2) was obtained at 500 degrees C. The increase of the e(31),(f) coefficient with increasing of the Rayleigh constant indicates the domain wall substantially contributes to the piezoelectric properties of the BiFeO3 films. MEMS-pVEHs measuring 1 x 6 mm(2) and Si proof mass of 3.0 mg were fabricated using the BiFeO3 film. The resonance frequency, electromechanical coupling factor, and mechanical quality factor were determined as 151.2 Hz, 0.1%, and 850, respectively. The maximum output power was 2.4 mu W at 0.3 G, which is comparable with that of the best-performing MEMS-pVEHs using Pb(Zr,Ti)O-3 films. (C) 2019 Elsevier B.V. All rights reserved.
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