4.8 Article

Probing Far-Infrared Surface Phonon Polaritons in Semiconductor Nanostructures at Nanoscale

期刊

NANO LETTERS
卷 19, 期 8, 页码 5070-5076

出版社

AMER CHEMICAL SOC
DOI: 10.1021/acs.nanolett.9b01350

关键词

Surface phonon polariton; EELS; STEM; zinc oxide; far-infrared; nanophotonics

资金

  1. National Key R&D Program of China [2016YFA0300804]
  2. National Natural Science Foundation of China [51672007, 11874130]
  3. National Equipment Program of China [ZDYZ2015-1]
  4. Open Research Fund Program of the State Key Laboratory of Low dimensional Quantum Physics [KF201904]
  5. National Program for Thousand Young Talents of China
  6. Electron Microscopy Laboratory in Peking University

向作者/读者索取更多资源

Phonon polaritons hold potential prospects of nanophotonic applications at the mid- and far-infrared wavelengths. However, their experimental investigation in the far-infrared range has long been a technical challenge due to the lack of suitable light sources and detectors. To obviate these difficulties, here we use an electron probe with sub-10 meV energy resolution and subnanometer spatial resolution to study far-infrared surface phonon polaritons (similar to 50-70 meV) in ZnO nanostructures. We observe ultraslow propagation and interference fringes of propagating surface phonon polaritons and obtain their dispersion relation through measurements in the coordinate space. By mapping localized modes in nanowires and flakes, we reveal their localized nature and investigate geometry and size effects. Associated with simulation, we show that surface phonon polariton behaviors can be well described by the local continuum dielectric model. Our work paves the way for spatial-resolved investigation of surface phonon polaritons by electron probes and forwards polaritonics in the far-infrared range.

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