期刊
APPLIED PHYSICS EXPRESS
卷 9, 期 6, 页码 -出版社
IOP PUBLISHING LTD
DOI: 10.7567/APEX.9.065801
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资金
- US Department of Homeland Security, Domestic Nuclear Detection Office [ECCS-1348269, 2013-DN-077-ER001]
The in-plane and out-of-plane mobility-lifetime products of electrons and holes in free-standing hexagonal boron nitride (hBN) films are extracted from current-voltage characteristics of metal-hBN-metal structures measured under external excitations. The in-plane mobility-lifetime products for electrons and holes are similar to 2.8 x 10(-5) and similar to 4.85 x 10(-6) cm(2)/V, measured from lateral carrier collection, whereas the out-of-plane mobility-lifetime products for electrons and holes are similar to 5.8 x 10(-8) and similar to 6.1 x 10(-9) cm(2)/V, measured from vertical carrier collection, respectively. The mobility-lifetime product is a few orders of magnitude higher along the plane than along the out of plane in hBN films. (C) 2016 The Japan Society of Applied Physics
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