期刊
IUCRJ
卷 6, 期 -, 页码 586-602出版社
INT UNION CRYSTALLOGRAPHY
DOI: 10.1107/S2052252519005128
关键词
fluorescence; X-ray absorption fine structure (XAFS); X-ray absorption spectroscopy (XAS); self-absorption; software and modelling
One of the most common types of experiment in X-ray absorption spectroscopy (XAS) measures the secondary inelastically scattered fluorescence photon. This widespread approach has a dominant systematic of self-absorption of the fluorescence photon. The large impact of self-absorption compromises accuracy, analysis and insight. Presented here is a detailed self-consistent method to correct for self-absorption and attenuation in fluorescence X-ray measurements. This method and the resulting software package can be applied to any fluorescence data, for XAS or any other experimental approach detecting fluorescence or inelastically scattered radiation, leading to a general solution applicable to a wide range of experimental investigations. The high intrinsic accuracy of the processed data allows these features to be well modelled and yields deeper potential insight.
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