In Situ Monitoring of Fluorescent Polymer Brushes by Angle-Scanning Based Surface Plasmon Coupled Emission

Fluorescent polymers have attracted interest in many fields such as sensing, diagnostics, imaging, and organic electronic devices. Real-time techniques to monitor and understand the polymerization process are important for obtaining controllable fluorescence polymers. We present a new technique to in situ monitor the growth process of fluorescent polymer brushes by using angle-scanning based surface plasmon coupled emission (AS-SPCE) approach during electrochemically mediated atom-transfer radical polymerization. The polymer thickness was determined by modeling the location of SPCE emission angle(s) with theoretical calculation. The advantages of unique angle distribution patterns, thickness dependence and effective background rejection of AS-SPCE guarantee the success in the real-time investigation for controllable fabrication of fluorescent polymers.