期刊
QUANTITATIVE INFRARED THERMOGRAPHY JOURNAL
卷 16, 期 3-4, 页码 203-217出版社
TAYLOR & FRANCIS LTD
DOI: 10.1080/17686733.2018.1563349
关键词
Lock-in thermography; electronic devices; failure analysis
资金
- German Federal Ministry for Economic Affairs and Energy in the 'SolarLIFE' [0325763 D]
Lock-in thermography (LIT) is a dynamic variant of infrared thermography, where local heat sources are periodically pulsed and amplitude and phase images of the surface temperature modulation are obtained. If used in electronic device testing, this method enables the localization of very weak local heat sources below the surface. This contribution reviews the basics and application of LIT for local efficiency analysis of solar cells and for failure analysis in other electronic components like bare and encapsulated integrated circuits. In both application fields LIT has established as a reliable and easy-to-use standard method for failure analysis.
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