4.3 Article

Forensic Identification of Automobile Window Glass Manufacturers in Japan Based on the Refractive Index, X-ray Fluorescence, and X-ray Absorption Fine Structure

期刊

ANALYTICAL SCIENCES
卷 32, 期 2, 页码 207-213

出版社

JAPAN SOC ANALYTICAL CHEMISTRY
DOI: 10.2116/analsci.32.207

关键词

Hit and run accident; source determination; automobile window glass; refractive index; x-ray fluorescence; x-ray absorption fine structure; FEFF simulation

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In this study, 3 automobile window glass manufacturers were identified based on refractive index, XRF, and XAFS analyses. The samples were classified into the corresponding groups using XRF, which should be the first step for identification. Samples having different manufacturing times showed differences in the refractive index. Based on XAFS, the amplitude of the EXAFS spectra and the intensities of Fourier transforms differed between manufacturers. In the scheme for manufacturer identification proposed in this study, performing XRF and refractive index studies is the first step. The concentrations of CeO2, MgO, Al2O3, and K2O allowed us to distinguish among manufacturers. Secondly, for samples containing cerium, we discriminated between manufacturer based on the amplitude of the EXAFS spectra and the intensities of Fourier transforms. As a result, the manufacturers of the 75 samples used in this study were multilaterally identified.

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