4.6 Article

Charge-Based EPFL HEMT Model

期刊

IEEE TRANSACTIONS ON ELECTRON DEVICES
卷 66, 期 3, 页码 1218-1229

出版社

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TED.2019.2893302

关键词

2-dimensional electron gas (2-DEG); compact modeling; GaAs; GaN; high-mobility field-effect transistor (HEMT); inversion coefficient; pinchoff surface potential; pinchoff voltage; quantum well (QW)

向作者/读者索取更多资源

This paper presents a design-oriented charge-based model for dc operation of AlGaAs/GaAs and AlGaN/GaN-based high-mobility field-effect transistors. The intrinsic model is physics-based and does not introduce any empirical parameter. The central concept is based on the linear approximation of the channel charge density with respect to the surface potential, leading to explicit and continuous expressions for charges and current in all the regions of operation, including subthreshold. In addition, an effective circuit design methodology based on the pinchoff surface potential, the pinchoff voltage and the key concept of inversion coefficient (IC) is proposed, likewise for silicon MOSFET circuits.

作者

我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。

评论

主要评分

4.6
评分不足

次要评分

新颖性
-
重要性
-
科学严谨性
-
评价这篇论文

推荐

暂无数据
暂无数据