4.8 Article

Temperature and Thickness Dependences of the Anisotropic In-Plane Thermal Conductivity of Black Phosphorus

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ADVANCED MATERIALS
卷 29, 期 5, 页码 -

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WILEY-V C H VERLAG GMBH
DOI: 10.1002/adma.201603756

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资金

  1. US Office of Naval Research (ONR) [N00014-14-1-0200]
  2. ONR [N00014-16-1-2293]
  3. US Department of Energy Office of Basic Science [DE-FG02-07ER46377]
  4. US National Science Foundation [EFRI 1433467]
  5. Air Force Office of Scientific Research, USAF [FA9550615-1-0187 DEF]
  6. European Union [645776]
  7. Emerging Frontiers & Multidisciplinary Activities
  8. Directorate For Engineering [1433467] Funding Source: National Science Foundation

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The anisotropic basal-plane thermal conductivities of thin black phosphorus obtained from a new four-probe measurement exhibit much higher peak values at low temperatures than previous reports. First principles calculations reveal the important role of crystal defects and weak thickness dependence that is opposite to the case of graphene and graphite due to the absence of reflection symmetry in puckered phosphorene.

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