4.5 Article

Stability and Reliability of PTB7:PC71BM and PTB7:PC61BM Inverted Organic Solar Cells: A Comparative Study

期刊

IEEE JOURNAL OF PHOTOVOLTAICS
卷 9, 期 1, 页码 183-193

出版社

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/JPHOTOV.2018.2874952

关键词

Device lifetime; organic solar cells (OSCs); PC71BM and PC61BM; PTB7; stability and reliability

资金

  1. Ministry of New and Renewable Energy (MNRE), Government of India [31/18/2009-10/PVSE]
  2. Department of Science & Technology, Government of India through INSPIRE Faculty Award [DST/INSPIRE/04/2015/003204]

向作者/读者索取更多资源

Blends of poly[[4,8-bis[(2-ethylhexyl)oxy]benzo[1,2-b:4,5-b']dithiophene-2,6-diyl][3-fluoro-2-[(2-ethylhexyl)carbonyl] thieno[3,4-b]thiophenediyl]] (PTB7) molecule with [6,6]-phenyl C-71-butyric acid methyl ester (PC71BM) and, sometimes, with [6,6]-phenyl C-61-butyric acid methyl ester (PC61BM) are popular for the fabrication of organic solar cell devices with efficiencies greater than 7% in many laboratories around the world. However, these devices have a poor lifetime, even in comparison with many other organic active layer solar cells. In this paper, PTB7: PC71BM and PTB7:PC61BM active layer devices fabricated in a stable process line have been systematically studied to understand the device degradation processes. The studies show that PTB7:PC61BM devices have a longer shelf-life in comparison with PTB7:PC71BM devices, with a median T80 (time for the efficiency to decrease to 80% of the pristine device) of SO and 11 days, respectively. The lifetimes of both these devices when exposed to outdoor sunlight, however, are very low (median T80 of about 6 h). Time analyses of device photovoltaic parameters, dark current-voltage characteristics, and the spectra of external quantum efficiencies help get an insight into the reasons for device degradation. The shelf-life degradation process is dominated by trap formation and charge extraction limitations. Light-exposure degradation is dominated by lower light absorption because of material degradation in the device active layer. These results should help in the design of more stable and improved PTB7-based devices.

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