期刊
JOURNAL OF THE KOREAN PHYSICAL SOCIETY
卷 73, 期 10, 页码 1546-1549出版社
KOREAN PHYSICAL SOC
DOI: 10.3938/jkps.73.1546
关键词
Graphene; ZnO; In-situ XPS; Interface; Thin film; Electron transfer; Dipole
资金
- Kwangwoon University
We have investigated core-levels of ZnO thin films at the interface with the graphene on Cu foil using in-situ X-ray Photoelectron Spectroscopy (XPS). Spectral evolution of C 1s, Zn 2p, and O 1s are observed in real time during RF sputtering deposition. We found binding energy (BE) shifts of Zn 2p and Zn-O' state of O 1s depending on ZnO film thickness. Core-levels BE shifts of ZnO will be discussed on the basis of electron transfer at the interface and it may have an important role in the electronic transport property of the ZnO/graphene-based electronic device.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据