期刊
SCIENCE BULLETIN
卷 60, 期 1, 页码 71-75出版社
ELSEVIER
DOI: 10.1007/s11434-014-0571-4
关键词
Electron beam effect; In situ electron microscopy; Structure transformation; Si nanowires; ZnO nanowires
资金
- National Basic Research Program of China [2009CB623701]
- National Natural Science Foundation of China [11374174, 51390471]
Electron beam (e-beam) irradiation is an inevitable, but crucial issue for electron microscopy. Our investigation results show the e-beam-induced in situ structural transformations in silicon (Si) nanowires and zinc oxide (ZnO) nanowires (NWs), respectively. Crystal to amorphous structure transition was revealed in Si NWs utilizing high resolution electron microscopy and electron energy loss spectroscopy. Reconstruction at the (10 (1) over bar0) surface of ZnO NWs was also observed in the transmission electron microscope (TEM) using aberration-corrected electron microscopy. These e-beam-induced in situ structural transformations prove that the electron beam irradiation effect is able to be used for the local modification of one-dimensional nanomaterials.
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