期刊
JOURNAL OF SYNCHROTRON RADIATION
卷 22, 期 -, 页码 249-255出版社
INT UNION CRYSTALLOGRAPHY
DOI: 10.1107/S1600577514027854
关键词
X-ray FEL; phasing; radiation damage; SFX
Here, it is shown that simulated native serial femtosecond crystallography (SFX) cathepsin B data can be phased by rapid ionization of sulfur atoms. Utilizing standard software adopted for radiation-damage-induced phasing (RIP), the effects on both substructure determination and phasing of the number of collected patterns and fluences are explored for experimental conditions already available at current free-electron laser facilities.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据