期刊
IEEE TRANSACTIONS ON CYBERNETICS
卷 44, 期 5, 页码 681-694出版社
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TCYB.2013.2266336
关键词
Discriminant analysis; ensemble; logistic regression; ordinal classification; ordinal decomposition; ordinal regression; support vector machines; threshold models
类别
资金
- Spanish Ministerial Commission of Science and Technology (MICYT) [TIN2011-22794]
- FEDER funds
- Junta de Andalucia, Spain [P2011-TIC-7508]
The classification of patterns into naturally ordered labels is referred to as ordinal regression. This paper proposes an ensemble methodology specifically adapted to this type of problem, which is based on computing different classification tasks through the formulation of different order hypotheses. Every single model is trained in order to distinguish between one given class (k) and all the remaining ones, while grouping them in those classes with a rank lower than k, and those with a rank higher than k. Therefore, it can be considered as a reformulation of the well-known one-versus-all scheme. The base algorithm for the ensemble could be any threshold (or even probabilistic) method, such as the ones selected in this paper: kernel discriminant analysis, support vector machines and logistic regression (LR) (all reformulated to deal with ordinal regression problems). The method is seen to be competitive when compared with other state-of-the-art methodologies (both ordinal and nominal), by using six measures and a total of 15 ordinal datasets. Furthermore, an additional set of experiments is used to study the potential scalability and interpretability of the proposed method when using LR as base methodology for the ensemble.
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