期刊
IEEE JOURNAL OF PHOTOVOLTAICS
卷 4, 期 1, 页码 265-270出版社
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/JPHOTOV.2013.2287913
关键词
Degradation; interface phenomena; organic semiconductors; oxygen; solar cells
资金
- European Community's Seventh Framework Programme [287818]
Systematic device performance and air stability comparison of inverted architecture polythiophene: fullerene photovoltaic cells with eight different electron-collecting layers (ECLs) and two hole-collecting layers are presented in this study. Regardless of the ECL, we achieved an efficiency of over 3.5% and lifetime of over 1000 h. These results indicate the relative interchangeability of various solution-processed ECLs. Long-term (>5000 h) air exposure revealed a secondary failure mechanism of inverted cells, which is assigned to hindered exciton harvesting. Notably, devices with a polymeric hole-collecting layer and Ag/Al electrode exhibited the longest lifetime (defined as 80% of the initial performance) of 4000 h, compared with 3000 h for MoO3/Ag/Al.
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