期刊
IEEE JOURNAL OF PHOTOVOLTAICS
卷 2, 期 2, 页码 191-195出版社
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/JPHOTOV.2012.2184266
关键词
Conducting probe atomic force microscopy (CP-AFM); Ga content; photovoltaics; scanning capacitance microscopy (SCM); solar cells; type inversion
资金
- German Ministry for Environment [0327559H]
- G. M. J. Schmidt Minerva Centre for Supramolecular Architecture
- Kimmel Centre for Nanoscale Science
The photovoltaic performance of solar cells, based on a Cu(In1-x Ga-x)Se-2 (CIGS) absorber layer, is directly correlated with Ga composition. We have used scanning capacitance microscopy and conducting probe atomic force microscopy (CP-AFM) to provide microscopic electrical characterization of CIGS films with different Ga content. We found p- to n-type inversion at grain boundaries of the polycrystalline CIGS film, especially for Ga-poor compositions. The fraction of grain boundaries undergoing inversion dramatically decreased for Ga compositions above x = 0.32, the composition corresponding to a sharp efficiency drop of the complete cells. CP-AFM measurements showed a marked current drop at grain boundaries as the Ga composition rose above x = 0.32.
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