期刊
AIP ADVANCES
卷 3, 期 6, 页码 -出版社
AMER INST PHYSICS
DOI: 10.1063/1.4811275
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资金
- University of Maryland
- National Institute of Standards
- Technology Center for Nanoscale Science and Technology through the University of Maryland [70NANB10H193]
- National Institute of Standards and Technology
- United States Department of Energy's National Nuclear Security Administration [DE-AC04-94AL85000]
We report a fast, versatile photocurrent imaging technique to visualize the local photo response of solar energy devices and optoelectronics using near-field cathodoluminescence (CL) from a homogeneous quantum dot layer. This approach is quantitatively compared with direct measurements of high-resolution Electron Beam Induced Current (EBIC) using a thin film solar cell (n-CdS / p-CdTe). Qualitatively, the observed image contrast is similar, showing strong enhancement of the carrier collection efficiency at the p-n junction and near the grain boundaries. The spatial resolution of the new technique, termed Q-EBIC (EBIC using quantum dots), is determined by the absorption depth of photons. The results demonstrate a new method for high-resolution, sub-wavelength photocurrent imaging measurement relevant for a wide range of applications. (C) 2013 Author(s).
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