期刊
ADVANCED MATERIALS INTERFACES
卷 2, 期 15, 页码 -出版社
WILEY-BLACKWELL
DOI: 10.1002/admi.201500088
关键词
electrostriction; near-field microwave microscopy; piezoresponse force microscopy; permittivity; mapping; dieletrics
资金
- US Department of Energy, Basic Energy Sciences, Materials Sciences and Engineering Division through the Office of Science Early Career Research Program
- Division of Materials Sciences and Engineering
- Center for Nanophase Materials Sciences, DOE Office of Science User Facility
- German Science Foundation (DFG) through the Research Training School (Tunable Integratable Components for Microwaves and Optics) [GRK 1037]
Two scanning probe microscopy techniquesnear-field scanning microwave microscopy (SMM) and piezoresponse force microscopy (PFM)-are used to characterize and image tunability in a thin (Ba,Sr)TiO3 film with nanometer scale spatial resolution. While sMIM allows direct probing of tunability by measurement of the change in the dielectric constant, in PFM, tunability can be extracted via electrostrictive response. The near-field microwave imaging and PFM provide similar information about dielectric tunability with PFM capable to deliver quantitative information on tunability with a higher spatial resolution close to 15 nm. This is the first time, information about the dielectric tunability is available on such length scales.
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