期刊
SCIENCE IN CHINA SERIES B-CHEMISTRY
卷 52, 期 2, 页码 174-180出版社
SCIENCE PRESS
DOI: 10.1007/s11426-009-0009-z
关键词
stacking disorder; graphite; X-ray diffraction; fault broadening effect
资金
- National Natural Science Foundation of China [20773157]
The broadening effect of stacking disorder in hexagonal graphite is found experimentally by XRD to be identical to that of stacking faults in hexagonal-closed-packing (HCP) structure, which has obvious selective broadening effect. The Langford's method for dealing with the twofold broadening effects of the crystallite-faults in hexagonal ZnO has been extended in this paper, and then applied to the determination of stacking disorder in 2H-graphite, which indicates that our extension method is convenient to both the experiments and data process, and may be generalized further. Two stacking disorder model in 2H-graphite and data processing method have been proposed in this study. The two disorder degrees of P (AB) and P (ABC) can be computed when the two reliable FWHMs of 101 and 102 diffraction peaks were obtained.
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