期刊
OPTICAL MATERIALS EXPRESS
卷 4, 期 2, 页码 403-410出版社
OPTICAL SOC AMER
DOI: 10.1364/OME.4.000403
关键词
-
资金
- Moncloa Campus of International Excellence (UCM-UPM)
- Los Alamos Laboratory Directed Research and Development (LDRD)
- Spanish ministry MINECO [AIC-A-2011-0718, MAT-2012-38541]
Optical properties of AgxAu1-x alloys were obtained experimentally using spectroscopic ellipsometry measurements on thin films fabricated by electron beam evaporation. Thin film thicknesses varied between 170 and 330 nm, making size effects negligible. Values of the complex refractive index of the pure metals were in good agreement with literature reports. The optical data set reported in this work can accurately reproduce experimental results. This is very important because there are not reliable and systematic optical constants for the alloys. Moreover, we show that the weighted average of the refractive indices of the pure metals fails to represent those of the alloys, not only in the region near the onset for interband transitions but also in the near-IR region. (C) 2014 Optical Society of America
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据