期刊
BEILSTEIN JOURNAL OF NANOTECHNOLOGY
卷 4, 期 -, 页码 198-207出版社
BEILSTEIN-INSTITUT
DOI: 10.3762/bjnano.4.20
关键词
amplitude-modulation; atomic force microscopy; frequency-modulation; phase-locked loop; spectroscopy
资金
- U.S. National Science Foundation [CMMI-0841840]
- Department of Energy [DESC0008115]
- Maryland NanoCenter
- NispLab.
- NSF as a MRSEC
- Div Of Civil, Mechanical, & Manufact Inn
- Directorate For Engineering [0841840] Funding Source: National Science Foundation
We present an overview of the bimodal amplitude-frequency-modulation (AM-FM) imaging mode of atomic force microscopy (AFM), whereby the fundamental eigenmode is driven by using the amplitude-modulation technique (AM-AFM) while a higher eigenmode is driven by using either the constant-excitation or the constant-amplitude variant of the frequency-modulation (FM-AFM) technique. We also offer a comparison to the original bimodal AFM method, in which the higher eigenmode is driven with constant frequency and constant excitation amplitude. General as well as particular characteristics of the different driving schemes are highlighted from theoretical and experimental points of view, revealing the advantages and disadvantages of each. This study provides information and guidelines that can be useful in selecting the most appropriate operation mode to characterize different samples in the most efficient and reliable way.
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