Soft Interfaces and Resonant Investigation on Undulator Source: A Surface X-ray Scattering Beamline to Study Organic Molecular Films at the SOLEIL Synchrotron

The SIRIUS beamline on the French Synchrotron radiation facility, SOLEIL, is able to perform on soft interfaces most of the grazing incidence techniques of investigation based on X-ray interaction with matter. Grazing Incidence X-ray Diffraction (GIXD), Grazing Incidence Small Angle X-ray Scattering (GISAXS), and Total Reflection X-ray Fluorescence (TRXF) can be applied on organized molecular films including Langmuir monolayers on liquid substrate. Several sample environments are available and adapted to X-ray measurements. Thanks to high-resolution Soller slits, the in-plane scattering wave vector resolution is better than 0.02 nm(-1). For GISAXS measurement scattering wave vector lower than 0.05 nm(-1) have been already reached and this will be improved in the future. Special attention has been paid to enable simultaneous or at least consecutive use of all these techniques on the same sample.