期刊
IEEE JOURNAL OF PHOTOVOLTAICS
卷 5, 期 6, 页码 1769-1774出版社
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/JPHOTOV.2015.2470082
关键词
Admittance spectroscopy; Cu(In, Ga)Se-2 (CIGS); defects; photovoltaic cells; photoluminescence; Sb doping; thin films
资金
- U.S. Department of Energy [DE-AC36-08-GO28308]
- National Renewable Energy Laboratory
In this study, we incorporated Sb into the precursor that was subsequently converted to Cu(In,Ga)Se-2 (CIGS) by a selenization process. We observed enhanced grain size and improved device performance compared with similarly processed CIGS films made without Sb. The optoelectronic properties of the Sb-doped CIGS films were examined with photoluminescence (PL) and admittance spectroscopy. These techniques allowed us to explore the changes in native defect compensation and evaluate the origin of a lower energy PL peak that is not typically seen in CIGS.
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