期刊
ULTRAMICROSCOPY
卷 119, 期 -, 页码 18-23出版社
ELSEVIER
DOI: 10.1016/j.ultramic.2011.09.006
关键词
Low energy electron microscopy; Photo-emission electron microscopy; Retrospective
类别
The evolution of LEEM and the later extension to spectroscopic PEEM, which run more or less parallel to Gertrude F. Rempfer's involvement in UV-PEEM and LEEM, are recounted with emphasis on instrumentation. (C) 2011 Elsevier B.V. All rights reserved.
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