期刊
ULTRAMICROSCOPY
卷 111, 期 7, 页码 798-806出版社
ELSEVIER SCIENCE BV
DOI: 10.1016/j.ultramic.2010.11.003
关键词
X-ray diffraction; Fluctuation scattering; Angular correlations; Structure determination
类别
资金
- DOE [DE-SC0002141, DE-FG02-06-ER46277]
- Research Growth Initiative of the University of Wisconsin-Milwaukee
We amplify on the principles of the method we have recently proposed for recovering an oversampled diffraction pattern of a single particle from measured diffraction patterns from multiple particles in orientations related by rotation about an axis parallel to the incident radiation. We propose an alternative method of phasing a reference resolution ring by means of a non-negativity constraint on the diffraction intensities, point out the need for caution about enantiomeric ambiguities in the reconstruction of a diffraction pattern from its angular correlations, and show that converged correlations may be deduced by appropriate averaging of even very noisy data. (C) 2010 Elsevier B.V. All rights reserved.
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