4.4 Article

The beam divergence of an indium LMIS at a distance of 50 μm as determined by plasma diagnostic measurements

期刊

ULTRAMICROSCOPY
卷 111, 期 8, 页码 969-972

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ELSEVIER
DOI: 10.1016/j.ultramic.2011.01.040

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LMIS; FEEP; Field emission; Indium; Beam divergence; Charged particle optics; Propulsion; Plasma diagnostic

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The current-dependent beam divergence at a distance of 50 pm from an indium-liquid metal ion source is derived from experimental data obtained by measuring the beam spread with a 3D Plasma diagnostic system at a distance of 10 cm from the needle tip. The observed relationship between emission current and beam divergence in vicinity of the emitting needle is used to design a focusing electrode for a field-emission electric propulsion thruster operating at currents up to 150 mu A. Another application involves focused ion beam columns which may choose to forego a beam-limiting aperture, such as LMIS-based rapid machining tools with large beam currents. (C) 2011 Elsevier B.V. All rights reserved.

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