期刊
ULTRAMICROSCOPY
卷 110, 期 6, 页码 582-585出版社
ELSEVIER
DOI: 10.1016/j.ultramic.2010.02.014
关键词
Multifrequency; High-speed phase modulation; Atomic force microscopy; Elasticity
类别
资金
- Grants-in-Aid for Scientific Research [20221004] Funding Source: KAKEN
We have developed a new technique, called multifrequency high-speed phase-modulation atomic force microscopy (PM-AFM) in constant-amplitude (CA) mode based on the simultaneous excitation of the first two flexural modes of a cantilever. By performing a theoretical investigation, we have found that this technique enables the simultaneous imaging of the surface topography, energy dissipation and elasticity (nonlinear mapping) of materials. We experimentally demonstrated high-speed imaging at a scan speed of 5 frames/s for a polystyrene (PS) and polyisobutylene (PIB) polymer-blend thin-film surface in water. (C) 2010 Elsevier B.V. All rights reserved.
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