期刊
ULTRAMICROSCOPY
卷 110, 期 2, 页码 130-133出版社
ELSEVIER
DOI: 10.1016/j.ultramic.2009.10.010
关键词
Electron diffraction; Diffractive imaging; Phase retrieval; Scanning electron microscope
类别
资金
- Japan Science and Technology Agency (JST)
A new electron diffraction microscope based on a conventional scanning electron microscope (SEM), for obtaining atomic-level resolution images without causing serious damage to the specimen, has been developed. This microscope in the relatively low-voltage region makes it possible to observe specimens at suitable resolution and record diffraction patterns. Using the microscope we accomplished 10-kV diffractive imaging with the iterative phase retrieval and reconstructed the structure of a multi-wall carbon nanotube with its finest feature corresponding to 0.34-nm carbon wall spacing. These results demonstrate the possibility of seamless connection between observing specimens by SEM and obtaining their images at high resolution by diffractive imaging. (C) 2009 Elsevier B.V. All rights reserved.
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