4.4 Article Proceedings Paper

Prerequisites for a Cc/Cs-corrected ultrahigh-resolution TEM

期刊

ULTRAMICROSCOPY
卷 108, 期 3, 页码 167-178

出版社

ELSEVIER SCIENCE BV
DOI: 10.1016/j.ultramic.2007.07.007

关键词

high-resolution TEM; electron microscope design; particle optics; aberration correction

向作者/读者索取更多资源

After the introduction of a corrector to compensate for the spherical aberration of a TEM and the acceptance of this new instrumentation for high-resolution CTEM (conventional transmission electron microscope) and STEM (scanning transmission electron microscope) by the electron microscopy community, a demand for even higher resolution far below 1 (A) over circle has emerged. As a consequence several projects around the world have been launched to make these new instruments available and to further push the resolution limits down toward fractions of 1 (A) over circle. For this purpose the so-called TEAM (transmission electron aberration-corrected microscope) has been initiated and is currently under development. With the present paper we give a detailed assessment of the stability required for the base instrument and the electric stability, the manufacturing precision, and feasible semi-automatic alignment procedures for a novel C-c/C-s-corrector in order to achieve aberration-free imaging with an information limit of 0.5 (A) over circle at an acceleration voltage of 200kV according to the goals for the first TEAM instrument. This new aberration corrector, a so-called Achroplanat, in combination with a very stable high-resolution TEM leads to an imaging device with unprecedented resolving power and imaging properties. (c) 2007 Elsevier B.V. All rights reserved.

作者

我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。

评论

主要评分

4.4
评分不足

次要评分

新颖性
-
重要性
-
科学严谨性
-
评价这篇论文

推荐

暂无数据
暂无数据