期刊
TRIBOLOGY LETTERS
卷 42, 期 3, 页码 319-324出版社
SPRINGER/PLENUM PUBLISHERS
DOI: 10.1007/s11249-011-9776-8
关键词
Unlubricated friction; Silicon; Titanium; AFM; Surface roughness; Focused ion beam
Friction between titanium spheres and an artificially structured silicon surface was measured with a friction force microscope. Two spheres with radii of 2.3 mu m and 7.9 mu m were firmly glued to the tip of the microscope cantilever. A periodic stripe pattern with a groove depth of 26 nm and systematically increasing groove width from 500 nm to 3500 nm was fabricated from a silicon wafer with a focused ion beam. The sphere substrate friction coefficient shows a strong enhancement at a certain groove periodicity, which is related to geometrical interlocking of the two surfaces. This shows that careful modification of the surface roughness can help to control the tribological behavior of mesoscale contacts.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据