期刊
TRAC-TRENDS IN ANALYTICAL CHEMISTRY
卷 29, 期 6, 页码 479-496出版社
ELSEVIER SCI LTD
DOI: 10.1016/j.trac.2010.04.001
关键词
Angle-dependent measurement; GI-XRF; Glancing incident; SR-TXRF; Synchrotron radiation; Total reflection X-ray fluorescence analysis; TXRF; TXRF-XANES; X-ray absorption near-edge structure spectroscopy
Synchrotron radiation-induced total reflection X-ray fluorescence (SR-TXRF) analysis is a high sensitive analytical technique that offers limits of detection in the femtogram range for most elements. Besides the analytical aspect, SR-TXRF is mainly used in combination with angle-dependent measurements and/or X-ray absorption near-edge structure (XANES) spectroscopy to gain additional information about the investigated sample. In this article, we briefly discuss the fundamentals of SR-TXRF and follow with several examples of recent research applying the above-mentioned combination of techniques to analytical problems arising from industrial applications and environmental research. (C) 2010 Elsevier Ltd. All rights reserved.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据