期刊
THIN SOLID FILMS
卷 519, 期 1, 页码 450-452出版社
ELSEVIER SCIENCE SA
DOI: 10.1016/j.tsf.2010.07.075
关键词
Resistance random access memory; Resistive switching; Co3O4 film; Pulsed laser deposition; Unipolar switching; Switching mechanism
类别
资金
- National Natural Science Foundation of China [10804048]
- 863 Project of China [2008AA031401]
- State Key Program for Basic Research of China [2010CB630704]
- National Key Project [2009ZX02023-5-4]
Unipolar resistive switching behavior has been investigated in Pt/Co3O4/Pt stacks. The resistance ratio of the high- and low- resistance states is over 5 x 10(3). The ON/OFF operation of the memory cells can be repeated more than 200 times at room temperature. The resistance of the two states can be kept for more than 16 h without showing degradation. The temperature dependence of the resistance shows a metallic behavior at the low-resistance state, but a semiconductor-behavior at the high-resistance state. The mechanism responsible for the observed unipolar resistive switching behavior has been discussed. (C) 2010 Elsevier B.V. All rights reserved.
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