期刊
THIN SOLID FILMS
卷 518, 期 10, 页码 2764-2768出版社
ELSEVIER SCIENCE SA
DOI: 10.1016/j.tsf.2009.08.047
关键词
Elastic properties; Electrical properties; Hardness; Organic semiconductor
类别
资金
- Nanotex Corporation
- Japan Science and Technology (JST) agency
- Grants-in-Aid for Scientific Research [22560094] Funding Source: KAKEN
Critical bending radii of some organic thin films were predicted using nanoindentation data and a prediction equation. Electrical behaviors of elastically bent organic field effect transistor(OFET) were also calculated assuming that dimensional changes in the films give rise to electrical changes. The predicted critical bending radius of a pentacene film (4.42 mm) agreed well with the experimental radius from the literature (4.6 mm) within a difference of 4%. The relative source-drain current behaviors predicted for pentacene OFETs using a conventional prediction equation are quite different from the experimental behaviors reported in the literature. (C) 2009 Elsevier BM. All rights reserved.
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