期刊
THIN SOLID FILMS
卷 518, 期 23, 页码 7113-7118出版社
ELSEVIER SCIENCE SA
DOI: 10.1016/j.tsf.2010.06.042
关键词
Poly(3-hexylthiophene); Degradation; X-ray photoelectron spectroscopy; Organic photovoltaic; UV light irradiation
X-ray photoelectron spectroscopy (XPS) was used to monitor the chemical changes resulting from irradiation (>295 nm) in air of poly(3-hexylthiophene) (P3HT), polymer which is a good candidate for photovoltaic applications. The formation of carbonyl moieties and the stepwise oxidation of sulphur atoms were characterised. The oxidation and the cleavage of the hexyl side-chain was monitored. It is also shown that sulfur was first converted into sulfoxides, then into sulfones and finally into sulfinate esters. The formation of these ultimate degradation products provoked a disruption of pi-conjugation in P3HT, leading to diminished visible absorbance. Based on these results, a mechanism of P3HT photooxidation is proposed. Comparison of XPS data with previously reported infrared and UV-visible spectral analysis showed that the information provided by these techniques is completely consistent. (C) 2010 Elsevier B.V. All rights reserved.
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