期刊
THIN SOLID FILMS
卷 517, 期 7, 页码 2519-2523出版社
ELSEVIER SCIENCE SA
DOI: 10.1016/j.tsf.2008.11.031
关键词
Cu2ZnSnS4; CZTS; Sputtering; Sulfurization; Thin film; Solar cell; Raman scattering
In the present work we report the results of the growth, morphological and structural characterization of Cu2ZnSnS4 (CZTS) thin films prepared by sulfurization of DC magnetron sputtered Cu/Zn/Sn precursor layers. The adjustment of the thicknesses and the properties of the precursors were used to control the final composition of the films. Its properties were studied by SEM/EDS, XRD and Raman scattering. The influence of the sulfurization temperature on the morphology. composition and structure of the films has been studied. With the presented method we have been able to prepare CZTS thin films with the kesterite structure. (C) 2008 Elsevier B.V. All rights reserved.
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