期刊
SURFACE SCIENCE
卷 604, 期 7-8, 页码 679-685出版社
ELSEVIER
DOI: 10.1016/j.susc.2010.01.015
关键词
XRD; Raman; Iron oxide; Thin film growth; Hematite; Magnetite
资金
- Deutsche Forschungsgemeinschaft (DFG) [PE 883/4-1, STA 1026/2-1]
We report on the identification of Fe3O4 (magnetite) and alpha-Fe2O3 (hematite) in iron oxide thin films grown on alpha-Al2O3(0001) by evaporation of Fe in an O-2-atmosphere with a thickness of a few unit cells. The phases were observed by Raman spectroscopy and confirmed by X-ray diffraction (XRD). Magnetite appeared independently from the substrate temperature and could not be completely removed by post-annealing in an oxygen atmosphere as observed by X-ray diffraction. In the temperature range between 400 degrees C and 500 degrees C the X-ray diffraction shows that predominantly hematite is formed, the Raman spectrum shows a mixture of magnetite and hematite. At both lower and higher substrate temperatures (300 degrees C and 600 degrees C) only magnetite was observed. After post-annealing in an O-2-atmosphere of 5 x 10(-5) mbar only hematite was detectable in the Raman spectrum. (C) 2010 Published by Elsevier B.V.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据