期刊
SURFACE SCIENCE
卷 604, 期 3-4, 页码 366-371出版社
ELSEVIER SCIENCE BV
DOI: 10.1016/j.susc.2009.11.032
关键词
Titanium oxide; Ultrathin films; Epitaxial growth; Electronic structure; XAS
资金
- European Community
- SIXTH FRAMEWORK PROGRAMME [STRP 505895-1]
- Italian Ministry of Instruction, University and Research (MIUR)
- University of Padova [CPDA038285]
We present the results of a XAS experiment carried out at the Ti 2p edge on well-ordered TiOx ultrathin films grown on the Pt(1 1 1) surface. XAS at the Ti 2p edge has been extensively applied to the study of Ti bulk compounds, particularly to the study of titania. According to the literature, the corresponding Ti 2p edge spectral shape is related to the stoichiometry and crystal field symmetry at the Ti sites. In the present study we aim at extending the potential of the XAS technique by discussing Ti 2p spectra obtained on several, dimensionally confined, TiOx phases in the form of ultrathin films. One of the main features of these films is their high degree of structural order. Furthermore, the results of previous studies provide valuable information about the chemistry and structure of the films, so that we are able to analyse the current XAS data in detail and to compare them with the appropriate Ti 2p XAS data of bulk oxides. We find that in the case of ultrathin film with a fully oxidised Ti4+ stoichiometry, the Ti 2p XAS data display features that are very similar to the ones observed in related bulk systems. The XAS data of the reduced TiOx films (with x < 2) show a rather different and specific shape. By comparing the experimental spectra with an atomic type of model calculation we show that the Ti 2p XAS profiles can be attributed mainly to stoichiometry-symmetry effects. (C) 2009 Elsevier B.V. All rights reserved.
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