相关参考文献
注意:仅列出部分参考文献,下载原文获取全部文献信息。Oxygen Reduction Reaction Activity and Electrochemical Stability of Thin-Film Bilayer Systems of Platinum on Niobium Oxide
Li Zhang et al.
JOURNAL OF PHYSICAL CHEMISTRY C (2010)
X-ray investigation of subsurface interstitial oxygen at Nb/oxide interfaces
M. Delheusy et al.
APPLIED PHYSICS LETTERS (2008)
Effect of thickness on the structure, morphology and optical properties of sputter deposited Nb2O5 films
Fachun Lai et al.
APPLIED SURFACE SCIENCE (2006)
The metal-insulator transition of NbO2:: An embedded Peierls instability
V Eyert
EUROPHYSICS LETTERS (2002)
Internal stress and optical properties of Nb2O5 thin films deposited by ion-beam sputtering
CC Lee et al.
APPLIED OPTICS (2002)
Development of dielectric properties of niobium oxide, tantalum oxide, and aluminum oxide based nanolayered materials
K Kukli et al.
JOURNAL OF THE ELECTROCHEMICAL SOCIETY (2001)
Oxidation of Nb(110) thin films on a-plane sapphire substrates: an X-ray study
O Hellwig et al.
PHYSICA B (2000)
Angle-resolved ultraviolet photoelectron spectroscopy of In-[perylene-3,4,9,10-tetracarboxylic dianhydride] system
Y Azuma et al.
JOURNAL OF APPLIED PHYSICS (2000)