相关参考文献
注意：仅列出部分参考文献，下载原文获取全部文献信息。The effect of incident angle on the C60+ bombardment of molecular solids
Joseph Kozole et al.
APPLIED SURFACE SCIENCE (2008)
Quantitative molecular depth profiling of organic delta-layers by C60 ion sputtering and SIMS
Alexander G. Shard et al.
JOURNAL OF PHYSICAL CHEMISTRY B (2008)
Measurement of sputtering yields and damage in C60SIMS depth profiling of model organic materials
A. G. Shard et al.
SURFACE AND INTERFACE ANALYSIS (2007)
Temperature-controlled depth profiling in polymeric materials using cluster secondary ion mass spectrometry (SIMS)
Christine M. Mahoney et al.
APPLIED SURFACE SCIENCE (2006)
分享论文
