期刊
SUPERLATTICES AND MICROSTRUCTURES
卷 60, 期 -, 页码 108-119出版社
ACADEMIC PRESS LTD- ELSEVIER SCIENCE LTD
DOI: 10.1016/j.spmi.2013.04.025
关键词
Zinc oxide; Cr-doped thin films; Wrinkled network structure; Optical conductivity
资金
- Faculty of Science, Fayoum University, Egypt
- Faculty of Science, Firat University, Turkey
Zn1-xCrxO thin films were grown on glass substrates by the sol-gel spin-coating technique. XRD results indicate that a ZnO single phase with a hexagonal wurtzite structure is formed. The films exhibit a preferential orientation along (002) direction in comparing with the other directions. AFM images of the films indicate that the Cr-doped ZnO films are consisted of a wrinkled network structure. The surface roughness of the films is increased with increasing Cr content. The optical band gap of Zn1-xCrxO thin films is decreased from 3.3 eV to 3.2 eV with the increase of Cr dopant ratio from x = 0% to x = 9.8% (in molar ratio). The observed red shift in optical band gap is due to s-d and p-d exchange interactions. Urbach energy, E-U, values are changed inversely with optical band gaps of the films. The refractive index and optical conductivity of the films were changed with Cr content. The obtained results suggest that the structural and optical properties of ZnO films can be controlled by Cr doping. (C) 2013 Elsevier Ltd. All rights reserved.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据