4.2 Article Proceedings Paper

Mechanical property measurement at the micro/nano-scale

期刊

STRAIN
卷 44, 期 1, 页码 20-26

出版社

WILEY
DOI: 10.1111/j.1475-1305.2008.00392.x

关键词

compression tests; digital imaging; MEMS; microspecimens; NEMS; tensile tests

向作者/读者索取更多资源

The introduction of sensors and actuators that have features on the scale of micrometres and nanometres has created a demand for new test methods to determine the mechanical properties of the materials used in them. These devices are fabricated by processes that are used in the microelectronics industry, and test specimens must be produced by the same processes. An entirely new area of experimental solid mechanics has developed over the past 15 years to meet these needs, and this paper summarises some of the progress. The coverage is limited to uniaxial tensile and compressive tests as these are the premier and standardised tests for macrospecimens.

作者

我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。

评论

主要评分

4.2
评分不足

次要评分

新颖性
-
重要性
-
科学严谨性
-
评价这篇论文

推荐

暂无数据
暂无数据