Hopping and trap controlled conduction in Cr-doped SrTiO3 thin films

This study examined the electrical conduction of Cr-doped SrTiO3 thin films in a metal (Pt)-insulator-metal (La0.5Sr0.5CoO3) structure. Two DC transport mechanisms, variable range hopping and the trap-controlled space-charge-limited current conduction, were found to be responsible for the conduction behavior. Resistance switching mechanism involved the trapping/detrapping of injected carriers at the weakly localized states. (C) 2012 Elsevier Ltd. All rights reserved.