4.5 Article

Stabilization of the delta-phase in Bi2O3 thin films

期刊

SOLID STATE IONICS
卷 255, 期 -, 页码 147-152

出版社

ELSEVIER SCIENCE BV
DOI: 10.1016/j.ssi.2013.12.027

关键词

Bismuth oxide; Sputtering; Thin films; Thermal stability

资金

  1. European Community [263878]
  2. CONACYT, (BisNano) [125141]

向作者/读者索取更多资源

In this paper, we report the stabilization of the delta-phase of Bi2O3 thin films from room temperature (RT) to 500 degrees C by the addition of tantalum ions. The delta-Bi2O3 phase is the material presenting the highest ionic conductivity; as bulk it is stable in a reduced temperature range from 730 to 825 degrees C, while the alpha-phase is the RT stable phase. However, when produced by atomic aggregation methods as a nanometric thin film, the delta-phase can be maintained at atmospheric conditions and it actually reverts to the alpha-phase only after thermal annealing, such transformation usually occurs around 250-350 degrees Cby passing through the beta-phase. In this work, we report that tantalum addition during the deposition of the Bi2O3 films by magnetron sputtering allows the maintenance of the delta phase up to 500 degrees C upon thermal annealing in air. (C) 2013 Elsevier B.V. All rights reserved.

作者

我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。

评论

主要评分

4.5
评分不足

次要评分

新颖性
-
重要性
-
科学严谨性
-
评价这篇论文

推荐

暂无数据
暂无数据