4.7 Article

Intrinsic burn-in efficiency loss of small-molecule organic photovoltaic cells due to exciton-induced trap formation

期刊

SOLAR ENERGY MATERIALS AND SOLAR CELLS
卷 118, 期 -, 页码 116-123

出版社

ELSEVIER
DOI: 10.1016/j.solmat.2013.08.006

关键词

Reliability; Lifetime; Aging; Small molecule

资金

  1. U.S. Department of Energy SunShot Program [DE-EE0005310]
  2. Center for Solar and Thermal Energy Conversion
  3. Department of Energy Frontier Research Center at the University of Michigan [DE-SC000957]

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The intrinsic degradation mechanisms leading to the initial burn-in deterioration in power conversion efficiency in small-molecule-based organic photovoltaics (OPVs) are studied. Specifically, we examine degradation in archetype boron subphthalocyanine chloride/fullerene OPVs in the absence of atmospheric contaminants such as water and oxygen. During the initial burn-in period (< 20 h), planar OPVs employing C-60 as the acceptor exhibits a rapid decrease in efficiency that is primarily due to a reduction in photocurrent contributed by excitons generated in C-60, as observed by the changes in the spectrally-resolved external quantum efficiency. We develop an analytical model that ascribes the decrease in power conversion efficiency with aging to an energetically-driven increase in the density of exciton-induced quenching sites that hinder exciton diffusion to the donor-acceptor interface. This mechanism is mitigated by employing a C-70 acceptor, or a mixed donor-acceptor active layer where excitons are rapidly dissociated following photogeneration, thereby significantly reducing their lifetime and density. (C) 2013 Elsevier B.V. All rights reserved.

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